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ICE Folder Name: LOCKHEED ELECTRONICS (FAILURE ANALYSIS) P/Q #1524

Catalog Data

Collection Creator:
Integrated Circuit Engineering Corporation.  Search this
Type:
Archival materials
Date:
1972
Scope and Contents note:
Content Summary: Hybrid manufacturing process for negative logic modules
Collection Restrictions:
The collection is open for research use.
Collection Rights:
Collection items available for reproduction, but the Archives Center makes no guarantees concerning copyright restrictions. Other intellectual property rights may apply. Archives Center cost-recovery and use fees may apply when requesting reproductions.
Collection Citation:
I.C.E. Integrated Circuit Collection, Archives Center, National Museum of American History
See more items in:
I.C.E. Integrated Circuit Collection
Archival Repository:
Archives Center, National Museum of American History
EDAN-URL:
ead_component:sova-nmah-ac-0600-ref1687